发明名称 TEST CARRIER
摘要 A test carrier includes a base film that holds a die and a cover film that overlaps the base film so as to cover the die. The cover film has a self-adhesive property and is more flexible than the base film. The base film has a through hole. The through hole is formed in the vicinity of a region of the base film which contacts the die.
申请公布号 US2015168448(A1) 申请公布日期 2015.06.18
申请号 US201314390557 申请日期 2013.05.21
申请人 ADVANTEST CORPORATION 发明人 Nakamura Kiyoto;Fujisaki Takashi;Ichikawa Hiroki
分类号 G01R1/04;G01R31/00 主分类号 G01R1/04
代理机构 代理人
主权项 1. A test carrier configured to accommodate an electronic device to be tested, comprising: a connector configured to connect an internal space to an outside, wherein the internal space accommodates the electronic device to be tested.
地址 Tokyo JP