| 摘要 |
<p>Provided are: a device (100) for examining solar cell panels (M) which enables the presence of faults in the solar cell panels (M) to be easily and accurately determined; and a method for examining solar cell panels. The device (100) for examining the solar cell panels (M) determines the state of the solar cell panels (M), and is provided with: an AC-wave input unit (10) which inputs an examination AC wave (f) into the solar cell panels (M) to be examined; an AC-wave measurement unit (20) for measuring an attenuated AC wave (g) which is returned from the solar cell panels (M); a calculation unit (40) which calculates, on the basis of the examination AC wave (f) and the attenuated AC wave (g), the impedance (Z) of the solar cell panels (M); a frequency changing unit (30) which changes the frequency (f) of the AC-wave input unit (10); and a determination unit (50) which determines the state of the solar cell panels (M). The frequency changing unit (30) changes the frequency (f) of the AC-wave input unit (10) such that the impedance (Z) of the solar cell panels (M) becomes a minimum value. The determination unit (50) compares this minimum value with a reference value. Furthermore, in this method for examining the solar cell panels (M), the device (100) for examining the solar cell panels (M) is used.</p> |
