发明名称 MIRROR ARRANGEMENT FOR AN EUV PROJECTION EXPOSURE APPARATUS, METHOD FOR OPERATING THE SAME, AND EUV PROJECTION EXPOSURE APPARATUS
摘要 A mirror arrangement for an EUV projection exposure apparatus for microlithography comprises a plurality of mirrors each having a layer which is reflective in the EUV spectral range and to which EUV radiation can be applied, and having a main body. In this case, at least one mirror of the plurality of mirrors has at least one layer comprising a material having a negative coefficient of thermal expansion. Moreover, a method for operating the mirror arrangement and a projection exposure apparatus are described. At least one heat source is arranged, in order to locally apply heat in a targeted manner to the at least one layer having a negative coefficient of thermal expansion of the at least one mirror.
申请公布号 US2015168674(A1) 申请公布日期 2015.06.18
申请号 US201414584164 申请日期 2014.12.29
申请人 Carl Zeiss SMT GmbH 发明人 Bittner Boris;Wabra Norbert;Schneider Sonja;Schneider Ricarda;Wagner Hendrik;Iliew Rumen;Pauls Walter
分类号 G02B7/18;G02B27/00;G03F7/20;G02B17/06 主分类号 G02B7/18
代理机构 代理人
主权项
地址 Oberkochen DE