发明名称 MATERIAL DIAGNOSTIC METHOD
摘要 Provided is a material diagnostic method capable measuring and diagnosing in a nondestructive manner the type, quantity of occurrence, depth distribution, and the like of even very small microstructures of about several tens of μm or less with sufficiently good precision. A material diagnostic method for using ultrasonic waves in a nondestructive manner to diagnose microstructures generated in a material, wherein changes in the scattering of ultrasonic waves by crystal grains are captured from bottom face waves and backscattered waves to thereby quantify the amount of change in microstructures, using the fact that changes in the properties of crystal grains produced by microstructures affect the scattering of ultrasonic waves.
申请公布号 US2015168356(A1) 申请公布日期 2015.06.18
申请号 US201314405692 申请日期 2013.06.07
申请人 NUCLEAR FUEL INDUSTRIES, LIMITED ;THE UNIVERSITY OF TOKYO 发明人 Etoh Junji;Sagisaka Mitsuyuki;Isobe Yoshihiro;Okita Taira
分类号 G01N29/36;G01N29/11 主分类号 G01N29/36
代理机构 代理人
主权项 1. A material diagnostic method of performing non-destructive diagnosis of microstructures occurring in a material by using ultrasonic, wherein with utilizing a fact that a change in physical properties of crystal grain caused by microstructures affects ultrasonic scattering, a change in the ultrasonic scattering by crystal grains is recognized from bottom surface wave and backscattered wave so that an amount of change in the microstructures is quantified.
地址 Tokyo JP