| 摘要 |
<p>An automatic correction method for a padding height measurement machine. The method comprises: S1: forming a carrying hole (130) in a machine platform (120) or an outer frame (110) of a padding height measurement machine, and mounting a correction sampler wafer in the carrying hole (130); S2: photographing the correction sample wafer by using a probe (400) of the padding height measurement machine, and selecting a standard image; and S3: regulating the current of the probe (400), so that the brightness and the grey scale of the image photographed by the probe (400) match those of a standard image. Also disclosed is an automatic correction system for a padding height measurement machine. By correcting a detection light source of a padding height measurement machine, the brightness of the light source is more stable, thereby ensuring the measurement accuracy of the padding height measurement machine and the stability of a detection result; in addition, the service life of the detection light source can be extended by regulating a current.</p> |
