发明名称 Method for characterizing dielectric loss tangent
摘要 <p>A method for characterizing dielectric loss tangent of a dielectric material. The method includes: introducing an incident wave in a mismatched transmission line; measuring a first insertion loss from a first resulting standing wave, at a given frequency; augmenting the mismatched transmission line with the dielectric material; introducing the incident wave in the transmission line augmented with the dielectric material; measuring a second insertion loss from a second resulting standing wave, at the given frequency; and calculating the dielectric loss tangent based on the differences between the first and second measured insertion losses.</p>
申请公布号 EP2372377(A3) 申请公布日期 2015.06.17
申请号 EP20110160123 申请日期 2011.03.29
申请人 RAYTHEON COMPANY 发明人 EPPICH, RAYMOND DEAN
分类号 G01R27/26 主分类号 G01R27/26
代理机构 代理人
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