| 发明名称 | Sensing supply voltage swings within an integrated circuit | ||
| 摘要 | An integrated circuit including a plurality of sensors configured to sense variations in supply voltage levels at points within the integrated circuit is disclosed. The plurality of sensors are distributed across the integrated circuit and have transistor devices such that process variations in the transistor devices within the sensors are such that a sensing result will have a random voltage offset that has a predetermined probability of lying within a pre-defined voltage offset range. The integrated circuit is configured to transmit results from multiple ones of the plurality of sensors to processing circuitry such that the variations in the supply voltage levels can be determined with a voltage offset range that is reduced compared to the pre-defined voltage offset range. | ||
| 申请公布号 | US9057761(B2) | 申请公布日期 | 2015.06.16 |
| 申请号 | US201113341547 | 申请日期 | 2011.12.30 |
| 申请人 | ARM Limited | 发明人 | Whatmough Paul Nicholas;Bull David Michael;Das Shidhartha |
| 分类号 | G01R31/30 | 主分类号 | G01R31/30 |
| 代理机构 | Pramudji Law Group PLLC | 代理人 | Pramudji Law Group PLLC ;Pramudji Ari |
| 主权项 | 1. An integrated circuit comprising a plurality of sensors configured to sense variations in supply voltage levels at points within said integrated circuit, said plurality of sensors being distributed across said integrated circuit; said plurality of sensors comprising transistor devices such that local process variations in said transistor devices within said sensors are such that a sensing result will have a random voltage offset that has a predetermined probability of lying within a pre-defined voltage offset range; wherein said integrated circuit is configured to transmit results from multiple ones of said plurality of sensors to processing circuitry. | ||
| 地址 | Cambridge GB | ||