发明名称 Integrated circuit having improved radiation immunity
摘要 An integrated circuit having improved radiation immunity is described. The integrated circuit comprises a substrate; an n-well formed on the substrate; a p-well formed on the substrate; and a p-tap formed in the p-well adjacent to the n-well, wherein the p-tap extends between circuit elements formed in the n-well and circuit elements formed in the p-well, and is coupled to a ground potential. A method of forming an integrated circuit having improved radiation immunity is also described.
申请公布号 US9058853(B2) 申请公布日期 2015.06.16
申请号 US201213587823 申请日期 2012.08.16
申请人 XILINX, INC. 发明人 Hart Michael J.;Karp James
分类号 H01L27/11;G11C5/00;G11C11/412;H01L21/8238;H01L27/02;H03K19/003;H01L27/092 主分类号 H01L27/11
代理机构 代理人 King John J.
主权项 1. An integrated circuit having improved radiation immunity, the integrated circuit comprising: a substrate; an n-well formed on the substrate; a p-well formed on the substrate and extending along the n-well, wherein the integrated circuit comprises a plurality of memory cells having n-channel transistors in the p-well and p-channel transistors in the n-well and extending in a column along the p-well and n-well; and a p-tap formed in the p-well adjacent to the n-well, wherein the p-tap extends along the column of memory cells between the p-channel transistors formed in the n-well and the n-channel transistors formed in the p-well and is coupled to a ground potential.
地址 San Jose CA US