发明名称 |
Buried channel field-effect transistors |
摘要 |
Methods for forming a buried-channel field-effect transistor include doping source and drain regions on a substrate with a dopant having a first type; forming a doped shielding layer on the substrate in a channel region having a second doping type opposite the first type to displace a conducting channel away from a gate-interface region; forming a gate dielectric over the doped shielding layer; and forming a gate on the gate dielectric. |
申请公布号 |
US9059321(B2) |
申请公布日期 |
2015.06.16 |
申请号 |
US201213470620 |
申请日期 |
2012.05.14 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Cheng Kangguo;Khakifirooz Ali;Kulkarni Pranita;Ning Tak H. |
分类号 |
H01L21/338;H01L21/84;H01L27/12;H01L29/66;H01L29/10;H01L29/786;H01L29/78;H01L21/8238;H01L29/51 |
主分类号 |
H01L21/338 |
代理机构 |
Tutunjian & Bitetto, P.C. |
代理人 |
Tutunjian & Bitetto, P.C. ;Alexanian Vazken |
主权项 |
1. A method for forming a buried-channel field-effect transistor (FET) with a surface-channel FET, comprising:
forming a dummy gate in at least a surface-channel region and a buried channel region of a substrate; depositing dielectric material around the dummy gates; doping a plurality of source and drain regions on the substrate with a dopant having a first type; forming a mask over at least one surface-channel region after removal of the dummy gate; epitaxially growing a doped shielding layer on at least one buried-channel region of the substrate after forming the mask, wherein the doped shielding layer has a second doping type opposite the first type, and wherein said doped shielding layer is formed after the plurality of source and drain regions are doped; removing the surface-channel region mask; forming a gate dielectric doped shielding layer; and forming a gate on the gate dielectric. |
地址 |
Armonk NY US |