发明名称 Methods, apparatus and systems for measuring snow structure and stability
摘要 The present inventions relate generally to methods, apparatus and systems for measuring snow stability and structure which may be used to assess avalanche risk. The disclosed apparatus includes a sensing unit configured to measure a size of snow grains as the sensing unit is being driven into a layer of snow. The disclosed apparatus may also be configured to take other environmental measurements, including resistance to penetration, temperature, humidity, slope aspect and inclination. Methods and apparatus are also disclosed for generating a profile of snow grain size according to depth based on the measured size of snow grains. Systems and apparatus are also disclosed for sharing the generated profiles among a plurality of users via a central server, and for evaluating an avalanche risk at a geographic location.
申请公布号 US9057803(B2) 申请公布日期 2015.06.16
申请号 US201314063649 申请日期 2013.10.25
申请人 AVATECH, INC. 发明人 Christian James Loren;Whittemore Samuel Tileston;Markle Brinton Johnston Wadsworth
分类号 G01W1/00;G01W1/14;G01B21/18;G01N3/00;G01N17/00;G01B7/26;G08C17/02;G01N3/42 主分类号 G01W1/00
代理机构 Wilmer Cutler Pickering Hale and Dorr LLP 代理人 Wilmer Cutler Pickering Hale and Dorr LLP
主权项 1. An apparatus for measuring snow structure and stability comprising: a pole having a length, a first end and a second end; a sensing unit located at the first end of the pole, the sensing unit comprising a head shaped for probing a layer of snow, the sensing unit configured to measure a size of snow grains within the layer of snow; a range sensor configured to measure a distance between the range sensor and a surface of the layer of snow; and a processor configured to determine a depth of penetration based on the distance measured by the range sensor and the length of the pole; anddetermine a profile of snow grain size according to depth based on the measured size of snow grains measured by the sensing unit.
地址 Cambridge MA US