发明名称 High-temperature strain cell for tomographic imaging
摘要 This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.
申请公布号 US9057681(B2) 申请公布日期 2015.06.16
申请号 US201314081948 申请日期 2013.11.15
申请人 The Regents of the University of California 发明人 MacDowell Alastair A.;Nasiatka James;Haboub Abdel;Ritchie Robert O.;Bale Hrishikesh A.
分类号 G01N23/00;H01J35/14;G01N23/04 主分类号 G01N23/00
代理机构 Lawrence Berkeley National Laboratory 代理人 Lawrence Berkeley National Laboratory
主权项 1. An apparatus comprising: a chamber, the chamber comprising a top portion and a bottom portion, the top portion and the bottom portion each joined to a window material, the window material separating the top portion and the bottom portion and configured to transmit radiation used to characterize a sample, the top portion of the chamber defining a first port configured for a first cooled fixture, the bottom portion of the chamber defining a second port configured for a second cooled fixture, the first cooled fixture and the second cooled fixture configured to hold the sample in the chamber, the top portion of the chamber and the bottom portion of the chamber further defining a plurality of heating lamp ports, the plurality of heating lamp ports configured for a plurality heating lamps, the plurality of heating lamps positioned to heat the sample.
地址 Oakland CA US