发明名称 |
METHODS OF FORMING IMPURITY REGIONS AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES |
摘要 |
A method for forming impurity domains includes: a step of sequentially forming a first protective film, a mask film, a second protective film, and a photoresist film on a substrate; a step of forming a photoresist pattern by partially removing the photoresist film; a step of forming an ion injection mask including the first protective pattern, the mask film pattern, the second protective film pattern, and the photoresist pattern sequentially layered on the substrate by etching the second protective film, the mask film, the first protective film in sequence by using the photoresist pattern; and a step of injecting impurities on the upper part of the substrate which is exposed by the ion injection mask. Uniform impurity domains can be acquired by using a dual-layer ion injection mask. |
申请公布号 |
KR20150066196(A) |
申请公布日期 |
2015.06.16 |
申请号 |
KR20130151453 |
申请日期 |
2013.12.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAEK, JAE JIK;PARK, SANG JINE;YOON, BO UN;YOUN, YOUNG SANG;JEONG, JI MIN;CHA, JI HOON |
分类号 |
H01L21/266 |
主分类号 |
H01L21/266 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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