发明名称 Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths
摘要 A mechanism is described for facilitating optical testing of a device under test (DUT) using a testing mechanism having multiple testing paths according to one embodiment. A method of embodiments of the invention may include facilitating, via a loopback path, optical testing of the DUT in a loopback configuration. The loopback configuration may allow for looping between one or more transmitters and one or more receivers of the DUT. The method may further include facilitating, via a spectral path, spectral measurements relating to the DUT.
申请公布号 US9059803(B2) 申请公布日期 2015.06.16
申请号 US201213629840 申请日期 2012.09.28
申请人 Intel Corporation 发明人 Detofsky Abram M.;Nnebe Chukwunenye S.;Grossman Brett D.
分类号 G01N21/00;H04B10/40;H04B10/07 主分类号 G01N21/00
代理机构 Blakely, Sokoloff, Taylor & Zafman LLP 代理人 Blakely, Sokoloff, Taylor & Zafman LLP
主权项 1. An apparatus comprising: an optical testing assembly including a loopback path to facilitate optical testing of a device under test (DUT) in a loopback configuration, wherein the loopback configuration allows for looping between one or more transmitters and one or more receivers of the DUT, wherein the loopback path is further to facilitate re-performing of tasks already performed using at least one of a functional path and a spectral path, and parallel looping of the one or more transmitters and the one or more receivers to allow for simultaneous and repeated running of multiple tests without having to rely on a tester; and the spectral path to facilitate spectral measurements relating to the DUT.
地址 Santa Clara CA US