AN APPARATUS FOR THREE DIMENSIONAL THERMAL IMAGE MEASUREMENT AND A METHOD THEREOF
摘要
<p>The present invention relates to an apparatus for three-dimensional thermal image measurement and a method thereof, and more specifically, to a three-dimensional thermal image measurement and a method thereof which can find a process where an issue has occurred by outputting a three-dimensional thermal image of a subject to be measured and identifying the depth of a defect formed on the subject.</p>
申请公布号
KR101528200(B1)
申请公布日期
2015.06.12
申请号
KR20140192856
申请日期
2014.12.30
申请人
KOREA BASIC SCIENCE INSTITUTE
发明人
KIM, GHI SEOK;LEE, KYE SUNG;HUR, HWAN;KIM, GEON HEE;NAM, KI HWAN;SUNG, HA YEONG;KIM, SEON JIN