发明名称 SYSTEMS AND METHODS FOR DETERMINING AND ADJUSTING A LEVEL OF PARALLELISM RELATED TO BONDING OF SEMICONDUCTOR ELEMENTS
摘要 A bonding machine for bonding a semiconductor device comprises a support structure configured to support a substrate; a bond head assembly including a bonding tool configured to bond multiple semiconductor devices to a substrate; and a correction tool including a contact part configured to be located between the bonding tool and the support structure, wherein the contact part is configured to contact by each of the bonding tool and the support structure during a correction work.
申请公布号 KR20150064704(A) 申请公布日期 2015.06.11
申请号 KR20140172289 申请日期 2014.12.03
申请人 KULICKE AND SOFFA INDUSTRIES, INC. 发明人 SCHMIDT LANGE MICHAEL P.;WASSERMAN MATTHEW B.;BRAUN CHRISTOPHER W.
分类号 H01L21/60;H01L21/02 主分类号 H01L21/60
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