| 摘要 |
PROBLEM TO BE SOLVED: To provide a shape measurement device, a structure manufacturing system, a shape measurement method, a structure manufacturing method and a shape measurement program that take advantage of a performance of an imaging part by controlling intensity of pattern light. ! SOLUTION: A shape measurement device includes: a projection unit 10 that projects pattern light 100 to a measured object 2; an imaging part 50 that photographs the measured object 2 projected with the pattern light 100; a control unit 60 that controls intensity of the pattern light 100 in accordance with a distance to the measured object 2; and a computation unit 60 that obtains a three-dimensional shape of the measured object 2 from an image of the measured object 2 projected with the pattern light 100. ! COPYRIGHT: (C)2015,JPO&INPIT |
