发明名称 BIREFRINGENCE MEASUREMENT OF POLYCRYSTALLINE SILICON SAMPLES OR THE LIKE
摘要 <p>A birefringence measurement system includes a lens mounted for selective movement into and out of use in the optical setup so that a wide range of sample types can be handled by the system without reconfiguring the primary components of the optical setup of the system (moving the detector, changing the light source power, etc.) in a manner that would sacrifice the cost effectiveness, efficiency, mechanical reliability and repeatability of measurements for such systems.</p>
申请公布号 WO2015084612(A1) 申请公布日期 2015.06.11
申请号 WO2014US66989 申请日期 2014.11.23
申请人 HINDS INSTRUMENTS, INC. 发明人 WANG, BAOLIANG
分类号 G01J4/00 主分类号 G01J4/00
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