发明名称 |
LIGHTING APPARATUS, AND OPTICAL INSPECTION APPARATUS AND OPTICAL MICROSCOPE USING THE LIGHTING APPARATUS |
摘要 |
Provided are a lighting apparatus, and an optical inspection apparatus and an optical microscope using the lighting apparatus. The lighting apparatus includes a light source that emits light, an optical device that outputs light that is more uniformly intense over a predetermined ray angle distribution than light input thereto; a multi-reflection device that reflects light multiple times, the multi-reflection device having a light incident surface receiving light and a light emission surface that emits multiply reflected light, and a light diffusion device that diffuses the light emitted from the light emission surface of the multi-reflection device. The light source, the optical device, the multi-reflection device, and light diffusion device share an optical path. |
申请公布号 |
US2015160445(A1) |
申请公布日期 |
2015.06.11 |
申请号 |
US201414559337 |
申请日期 |
2014.12.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIMURA Nobuyuki;TOGASHI Mitsuhiro;TAKADA Masaki;NUMATA Mitsunori |
分类号 |
G02B21/06;F21V8/00;G02B21/00;G02B21/36 |
主分类号 |
G02B21/06 |
代理机构 |
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代理人 |
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主权项 |
1. A lighting apparatus, comprising:
a light source that emits light; an optical device that outputs light that is more uniformly intense over a predetermined ray angle distribution than light input thereto, the optical device being in a light path of the light source; a multi-reflection device that reflects light multiple times, the multi-reflection device having a light incident surface that receives light and a light emission surface that emits multiply-reflected light, the multi-reflection device being in a light path of the light source; and a light diffusion device that diffuses light emitted from the light emission surface of the multi-reflection device. |
地址 |
Suwon-si KR |