发明名称 |
SELECTION OF SPECTRAL BANDS OR FILTERS FOR MATERIAL CLASSIFICATION UNDER MULTIPLEXED ILLUMINATION |
摘要 |
Material classification using multiplexed illumination by broadband spectral light from multiple different incident angles, coupled with multi-spectral narrow band spectral measurement of light reflected from the illuminated object of unknown material, wherein selection of spectral bands for illumination or for narrow-band capture may comprise analysis of a database of labeled training material samples within a multi-class classification framework, captured using a relatively large number of spectral bands (such as 32 spectral bands), so as to select a subset of a relatively fewer number of spectral bands (such as 5 spectral bands), wherein the selected spectral bands in the subset retain a significant aptitude for distinguishing between different classifications of materials. |
申请公布号 |
US2015160128(A1) |
申请公布日期 |
2015.06.11 |
申请号 |
US201414309771 |
申请日期 |
2014.06.19 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
Liu Chao;Skaff Sandra |
分类号 |
G01N21/55 |
主分类号 |
G01N21/55 |
代理机构 |
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代理人 |
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主权项 |
1. A method for material classification of an object fabricated from an unknown material, comprising:
illuminating an object by multiplexed illumination; measuring multiple spectral bands of light reflected from the illuminated object; and classifying the material from which the object is fabricated using the measured reflected light; wherein with respect to the measured multiple spectral bands, wavelengths for the multiple spectral bands are selected by analysis of a database of labeled training material samples within a multi-class classification framework, captured using a relatively large number of spectral bands, so as to select a subset of a relatively fewer number of spectral bands, wherein the selected spectral bands in the subset have a significant aptitude for distinguishing between different classifications of materials in the database. |
地址 |
Tokyo JP |