发明名称 RADIATION SOURCE APPARATUS, LITHOGRAPHIC APPARATUS, ILLUMINATION SYSTEM AND METHOD FOR MITIGATING DEBRIS PARTICLES
摘要 PROBLEM TO BE SOLVED: To provide a radiation source apparatus for mitigating debris particles in a region in which radiation propagates from a radiation source to an illuminator of a lithographic apparatus.SOLUTION: A lithographic apparatus includes a radiation source SO for generating radiation, an illumination system for conditioning the radiation, a patterning device for patterning the conditioned radiation, and a projection system for projecting the patterned radiation onto a target portion of a substrate. The illumination system includes a debris mitigating system D for mitigating debris particles that are released with the generation of radiation, and an optical system OS for collecting the radiation. The debris mitigation system is arranged either to directly evaporate the debris particles, to directly charge the debris particles, to directly produce plasma out of the debris particles, or to do any combination thereof, in a path A1 in which the radiation propagates from the radiation source to the optical system.
申请公布号 JP2015109468(A) 申请公布日期 2015.06.11
申请号 JP20150008618 申请日期 2015.01.20
申请人 ASML NETHERLANDS BV 发明人 VADIM YEVGENYEVICH BANINE;BAKKER LEVINUS PIETER;KOLESNYCHENKO ALEKSEY YURIEVICH;MOORS JOHANNES HUBERTUS J;SCHUURMANS FRANK JEROEN PIETER
分类号 H01L21/027;H05G2/00 主分类号 H01L21/027
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