发明名称 SALT, RESIST COMPOSITION AND MANUFACTURING METHOD OF RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a salt capable of manufacturing a resist pattern with excellent line edge roughness (LER).SOLUTION: A compound is expressed by a formula (I). [In the formula (I), Qand Qare independently a fluorine atom or a perfluoroalkyl group having 1-6 carbon atoms. Lis a divalent saturated hydrocarbon group having 1-24 carbon atoms. Ris an alkanediyl group having 1-12 carbon atoms. Ris a hydrogen atom or an acid-labile group. W is an aliphatic ring having 3-36 carbon atoms. A methylene group forming the aliphatic ring may be substituted by an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group. A hydrogen atom included in the aliphatic ring may be substituted by a hydroxy group, an alkyl group having 1-12 carbon atoms or an alkoxy group having 1-12 carbon atoms. m is 0 or 1. Zis an organic counterion.]
申请公布号 JP2015107955(A) 申请公布日期 2015.06.11
申请号 JP20140215116 申请日期 2014.10.22
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ADACHI YUKAKO;ICHIKAWA KOJI;YASUE TAKAHIRO
分类号 C07C309/22;C07C381/12;G03F7/004;G03F7/038;G03F7/039 主分类号 C07C309/22
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