PARALLEL AND SERIAL ACCESS TO TEST COMPRESSION ARCHITECTURES

摘要

The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer's system. Additional embodiments are also provided and described in the disclosure.

主权项

1. A programmable access test compression architecture comprising:
A. functional circuitry having test stimulus inputs and test response outputs; B scan path circuits, each scan path circuit having a scan input, a scan output, a clock input, a scan enable input, stimulus outputs coupled to the stimulus inputs of the functional logic, and response inputs coupled to the response outputs of the functional logic; C. decompressor circuitry having compressed data inputs and having outputs connected to the scan inputs of the scan path circuits; D. compactor circuitry having inputs connected to the scan outputs of the scan path circuits and having compressed data outputs; E. a serial compressed data input and parallel compressed data inputs; F. an input shift register having a serial input connected to the serial compressed data input, parallel outputs, and a shift clock input; G. multiplexer circuitry having first inputs connected to the parallel compressed data inputs, second inputs connected to the parallel outputs of the input shift register, parallel outputs connected to the compressed data inputs of the compressor circuitry, and a select input; H. a serial compressed data output; I. an output shift register having parallel inputs connected to the compressed data outputs, a serial output connected to the serial compressed data output, and a shift clock input; J. a shift clock input coupled to the shift clock input of the input shift register and the shift clock input of the output shift register; K. a scan clock input coupled to the scan path circuits, the decompressor circuitry, and the compressor circuitry; and L. a scan enable input coupled to the scan path circuits, the decompressor circuitry, and the compressor circuitry.