发明名称 RESISTANCE VALUE MEASUREMENT METHOD OF CHIP RESISTOR, AND PACKAGING METHOD OF CHIP RESISTOR
摘要 <p>PROBLEM TO BE SOLVED: To provide a resistance value measurement method of a chip resistor capable of improving current detection accuracy.SOLUTION: The resistance value measurement method of the chip resistor is adapted to bring a current electrification probe 14 and a voltage measurement probe 15 into contact with top faces of a first electrode 12a and a second electrode 12b which oppose each other, respectively, in the chip resistor with which the first electrode 12a and the second electrode 12b are formed in both end portions of a resistance body 11, and to measure a resistance value of the resistance body 11 by measuring a voltage value with the voltage measurement probe 15 while making a current flow from the current electrification probe 14. The voltage measurement probe 15 is brought into contact with substantially central parts of the first electrode 12a and the second electrode 12b in the direction vertical to a direction where the first electrode 12a and the second electrode 12b oppose each other.</p>
申请公布号 JP2015108568(A) 申请公布日期 2015.06.11
申请号 JP20130251818 申请日期 2013.12.05
申请人 PANASONIC IP MANAGEMENT CORP 发明人 SAKAGUCHI YU
分类号 G01R27/02;H01C17/00 主分类号 G01R27/02
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