发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a highly reliable semiconductor device including a thin film transistor with stable electric characteristics, and to manufacture the highly reliable semiconductor device with high productivity and at a low cost.SOLUTION: A method for manufacturing a semiconductor device comprises a thin film transistor in which a semiconductor layer including a channel formation region, a source region, and a drain region are formed using an oxide semiconductor layer. In the method for manufacturing the semiconductor device, heat treatment (heat treatment for dehydration or dehydrogenation) for increasing purity of the oxide semiconductor layer and reducing moisture and the like as impurities is performed. Also, the heat-treated oxide semiconductor layers are slowly cooled under an oxygen atmosphere. |
申请公布号 |
JP2015109454(A) |
申请公布日期 |
2015.06.11 |
申请号 |
JP20140263776 |
申请日期 |
2014.12.26 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SASAKI TOSHINARI;SAKATA JUNICHIRO;OHARA HIROKI;YAMAZAKI SHUNPEI |
分类号 |
H01L21/336;G02F1/1368;H01L21/28;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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