发明名称 |
Dual-Gated Group III-V Merged Transistor |
摘要 |
There are disclosed herein various implementations of a group III-V merged cascode transistor. Such a group III-V merged cascode transistor includes a group III-V body disposed over a substrate and configured to produce a two-dimensional electron gas (2DEG). The group III-V body includes a group III-V barrier layer situated over a group III-V channel layer, and a source electrode and a drain electrode. The group III-V merged cascode transistor also includes an enable gate disposed in a recess extending substantially through the group III-V barrier layer, and an operational gate disposed over the group III-V barrier layer, the operational gate not being in physical contact with the enable gate. |
申请公布号 |
US2015162424(A1) |
申请公布日期 |
2015.06.11 |
申请号 |
US201414539885 |
申请日期 |
2014.11.12 |
申请人 |
International Re'ctifier Corporation |
发明人 |
Briere Michael A. |
分类号 |
H01L29/778 |
主分类号 |
H01L29/778 |
代理机构 |
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代理人 |
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主权项 |
1. A group III-V merged cascode transistor comprising:
a group III-V body disposed over a substrate and configured to produce a two-dimensional electron gas (2DEG), said group III-V body including a group III-V barrier layer situated over a group III-V channel layer; a source electrode and a drain electrode; an enable gate disposed in a recess extending substantially through said group III-V barrier layer, and an operational gate disposed over said group III-V barrier layer, said operational gate not being in physical contact with said enable gate. |
地址 |
EI Segundo CA US |