发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a first etching stopper film and a second etching stopper film that are formed to be spaced apart from one another on a first inter-layer insulating film; a metal thin film resistor formed to extend over the first and second etching stopper films; a second inter-layer insulating film formed on the first inter-layer insulating film to cover the first and second etching stopper films and the metal thin film resistor; a first contact hole formed in the second inter-layer insulating film to extend from a surface of the second inter-layer insulating film onto the first etching stopper film by penetrating through the metal thin film resistor; and a second contact hole formed in the second inter-layer insulating film to extend from a surface of the second inter-layer insulating film onto the second etching stopper film by penetrating through the metal thin film resistor.
申请公布号 US2015162396(A1) 申请公布日期 2015.06.11
申请号 US201414560745 申请日期 2014.12.04
申请人 ROHM CO., LTD. 发明人 YAGI Ryoutaro;KAGEYAMA Satoshi
分类号 H01L49/02;H01L21/308;H01L27/01 主分类号 H01L49/02
代理机构 代理人
主权项 1. A semiconductor device, comprising: a first etching stopper film and a second etching stopper film that are conductive and formed to be spaced apart from one another on a first inter-layer insulating film; a metal thin film resistor formed to extend over the first etching stopper film and the second etching stopper film on the first inter-layer insulating film; a second inter-layer insulating film formed on the first inter-layer insulating film to cover the first and second etching stopper films and the metal thin film resistor; a first contact hole formed in the second inter-layer insulating film to extend from a surface of the second inter-layer insulating film onto the first etching stopper film by penetrating through the metal thin film resistor; and a second contact hole formed in the second inter-layer insulating film to extend from the surface of the second inter-layer insulating film onto the second etching stopper film by penetrating through the metal thin film resistor.
地址 Kyoto JP