发明名称 MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, a memory device includes a first interconnect having a divided portion formed in the first interconnect, a memory cell member provided on the first interconnect, a second interconnect provided on the memory cell member, a semiconductor member provided on the first interconnect to be connected between portions of the first interconnect on two sides of the divided portion, an insulating film covering an upper surface of the semiconductor member and a side surface of at least an upper portion of the semiconductor member, and an electrode provided on the insulating film to cover the upper surface of the semiconductor member and the side surface of the at least an upper portion of the semiconductor member with the insulating film interposed.
申请公布号 US2015162380(A1) 申请公布日期 2015.06.11
申请号 US201414206597 申请日期 2014.03.12
申请人 Kabushiki Kaisha Toshiba 发明人 Nishihara Kiyohito;Saitoh Masumi
分类号 H01L27/24;G11C13/00;H01L45/00;H01L23/538 主分类号 H01L27/24
代理机构 代理人
主权项 1. A memory device, comprising: a first interconnect, a divided portion being formed in the first interconnect; a memory cell member provided on the first interconnect; a second interconnect provided on the memory cell member; a semiconductor member provided on the first interconnect to be connected between portions of the first interconnect on two sides of the divided portion; an insulating film covering an upper surface of the semiconductor member and a side surface of at least an upper portion of the semiconductor member; and an electrode provided on the insulating film to cover the upper surface of the semiconductor member and the side surface of the at least an upper portion of the semiconductor member with the insulating film interposed.
地址 Minato-ku JP