发明名称 MULTI-AXIS TYPE THREE-DIMENSIONAL MEASURING APPARATUS
摘要 A multi-axis type three-dimensional measuring apparatus includes a multi-axis arm mechanism, a probe formed in a distal end of the multi-axis arm mechanism and configured to measure a workpiece, and a projector formed in the distal end of the multi-axis arm mechanism and configured to scale a range of a projected projection image according to a distance between the workpiece and the probe. The projector is configured to project full-scale projection graphics of said workpiece so as to match the full-scale projection graphics with the workpiece regardless of a difference in a distance between the workpiece and the probe, and to project display information identifying a measurement schedule position by the probe.
申请公布号 US2015159987(A1) 申请公布日期 2015.06.11
申请号 US201414563205 申请日期 2014.12.08
申请人 MITUTOYO CORPORATION 发明人 ABE Shinsaku
分类号 G01B5/008 主分类号 G01B5/008
代理机构 代理人
主权项 1. A multi-axis type three-dimensional measuring apparatus comprising: a multi-axis arm mechanism; a probe formed in a distal end of the multi-axis arm mechanism and configured to measure a workpiece; and a projector formed in the distal end of the multi-axis arm mechanism and configured to scale a range of a projected projection image according to a distance between the workpiece and the probe, wherein the projector is configured to project full-scale projection graphics of said workpiece so as to match the full-scale projection graphics with the workpiece regardless of a difference in a distance between the workpiece and the probe, and to project display information identifying a measurement schedule position by the probe.
地址 Kawasaki-shi JP