发明名称 |
COMPOSITE CHARGED PARTICLE RADIATION DEVICE |
摘要 |
<p>A composite charged particle beams apparatus of the present invention allows a sample (5)'s cross-section or edge plane to be observed by using an electron beam (2b), the sample (5)'s cross-section or edge plane being fabricated by using an ion beam (1b). The radiation device includes a detector (7) which is capable of detecting low-loss back-scattered electrons (12) including elastically-scattered electrons (11), these electrons (12, 11) being induced by the electron beam (2b) with which the sample (5)'s cross-section or edge plane is irradiated. Moreover, it is desirable that the detector (7) be set up in a space outside an electron-beam column (2a). The above-described configuration has allowed implementation of the high-resolving-power and low-damage SEM observation of the surface information about material and composition of the sample's FIB-fabricated cross-section or edge plane. Furthermore, when detecting the low-loss back-scattered electrons (12), information about the different depths relative to the sample's surface has been also made available by selecting the energy bands of the detected electrons.</p> |
申请公布号 |
EP2426695(B1) |
申请公布日期 |
2015.06.10 |
申请号 |
EP20100769456 |
申请日期 |
2010.04.14 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
AGEMURA, TOSHIHIDE;NOMAGUCHI, TSUNENORI |
分类号 |
H01J37/28;H01J37/244;H01J37/26;H01J37/305;H01J37/317 |
主分类号 |
H01J37/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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