发明名称 自己整合した耐熱性コンタクトを備える半導体デバイス及びその作製方法
摘要 <p>Methods of forming semiconductor devices are provided by forming a semiconductor layer on a semiconductor substrate. A mask is formed on the semiconductor layer. Ions having a first conductivity type are implanted into the semiconductor layer according to the mask to form implanted regions on the semiconductor layer. Metal layers are formed on the implanted regions according to the mask. The implanted regions and the metal layers are annealed in a single step to respectively activate the implanted ions in the implanted regions and provide ohmic contacts on the implanted regions. Related devices are also provided.</p>
申请公布号 JP5730481(B2) 申请公布日期 2015.06.10
申请号 JP20090510966 申请日期 2007.05.03
申请人 发明人
分类号 H01L21/338;H01L21/28;H01L21/336;H01L29/778;H01L29/78;H01L29/786;H01L29/812 主分类号 H01L21/338
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