发明名称 METHOD AND APPARATUS FOR ANALYXING CHARATERS OF PARTICLES
摘要 <p>Disclosed is an apparatus for analyzing characteristics of particles, which obtains information of crystal structure, obtains movement data of particles in the crystal structure, judges whether the obtained distribution of the movement data is included in a confidence interval, uses the distribution of movement data included in the confidence interval, and determines characteristics of particles having the crystal structure.</p>
申请公布号 KR20150063952(A) 申请公布日期 2015.06.10
申请号 KR20140170822 申请日期 2014.12.02
申请人 SAMSUNG ELECTRONICS CO., LTD.;MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 MIARA LINCOLN;RICHARDS WILLIAM DAVIDSON;ONG SHYUE PING;MO YIFEI;CEDER GERBRAND
分类号 G01N15/00;G01N15/10;G01N27/02 主分类号 G01N15/00
代理机构 代理人
主权项
地址