发明名称 ESD保護素子を備える半導体装置およびESD保護素子を備える半導体装置の製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce an area required for an ESD protection element. <P>SOLUTION: A semiconductor device comprises: a P-type or an N-type substrate; a circuit arranged on the substrate; a first electrode pad and a second electrode pad for input or output of the circuit; an impurity diffusion region whose conductivity type is different from the type of the substrate; a first wiring that connects the first electrode pad to the impurity diffusion region; and a second wiring that connects the second electrode pad to an area of the substrate excluding the impurity diffusion region. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5732763(B2) 申请公布日期 2015.06.10
申请号 JP20100162903 申请日期 2010.07.20
申请人 发明人
分类号 H01L21/822;H01L27/04;H01L27/06 主分类号 H01L21/822
代理机构 代理人
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