发明名称 |
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME |
摘要 |
<p>An actinic ray-sensitive or radiation-sensitive resin composition including: (PA) a compound having a proton acceptor functional group and undergoing decomposition upon irradiation with an actinic ray or radiation to generate a compound reduced in or deprived of proton acceptor property or changed to be acidic from being proton acceptor-functioning, wherein a molar extinction coefficientεof the compound (PA) at a wavelength of 193 nm as measured in acetonitrile solvent is 55,000 or less, and a pattern forming method using the composition are provided.</p> |
申请公布号 |
EP2470957(A4) |
申请公布日期 |
2015.06.10 |
申请号 |
EP20100811784 |
申请日期 |
2010.08.17 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
SHIBUYA, AKINORI;YAMAGUCHI, SHUBEI;KATAOKA, SHOHEI;SHIRAKAWA, MICHIHIRO;KATO, TAKAYUKI;TANGO, NAOHIRO |
分类号 |
G03F7/004;C08F20/10;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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