发明名称 Semiconductor devices
摘要 A semiconductor device can include wiring lines on a substrate and an interlayer insulating structure, between ones of the wiring lines. The wiring lines can include a pore-containing layer that includes a plurality of pores extending away from a surface of the substrate, wherein ones of the pores have respective volumes that increase with a distance from the substrate until reaching an air gap layer above the pore-containing layer and beneath uppermost surfaces of the wiring lines.
申请公布号 US9053948(B2) 申请公布日期 2015.06.09
申请号 US201414256232 申请日期 2014.04.18
申请人 Samsung Electronics Co., Ltd. 发明人 Kim Kyoung-Hee;Lee Ho-Ki;Choi Gilheyun;Han Kyu-Hee;Hong Jongwon
分类号 H01L29/06;H01L21/764;H01L23/522;H01L23/532 主分类号 H01L29/06
代理机构 Myers Bigel Sibley & Sajovec, P.A. 代理人 Myers Bigel Sibley & Sajovec, P.A.
主权项 1. A semiconductor device, comprising: wiring lines on a substrate; an interlayer insulating structure between ones of the wiring lines; and a cover layer covering the wiring lines and the interlayer insulating structure, wherein the interlayer insulating structure comprises a non-porous layer without pores, a pore-containing layer with pores, and an air gap sequentially provided on the substrate, wherein respective volumes of the pores in the pore-containing layer increase monotonically with increased distance from a surface of the substrate.
地址 KR