发明名称 |
Semiconductor devices |
摘要 |
A semiconductor device can include wiring lines on a substrate and an interlayer insulating structure, between ones of the wiring lines. The wiring lines can include a pore-containing layer that includes a plurality of pores extending away from a surface of the substrate, wherein ones of the pores have respective volumes that increase with a distance from the substrate until reaching an air gap layer above the pore-containing layer and beneath uppermost surfaces of the wiring lines. |
申请公布号 |
US9053948(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201414256232 |
申请日期 |
2014.04.18 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Kyoung-Hee;Lee Ho-Ki;Choi Gilheyun;Han Kyu-Hee;Hong Jongwon |
分类号 |
H01L29/06;H01L21/764;H01L23/522;H01L23/532 |
主分类号 |
H01L29/06 |
代理机构 |
Myers Bigel Sibley & Sajovec, P.A. |
代理人 |
Myers Bigel Sibley & Sajovec, P.A. |
主权项 |
1. A semiconductor device, comprising:
wiring lines on a substrate; an interlayer insulating structure between ones of the wiring lines; and a cover layer covering the wiring lines and the interlayer insulating structure, wherein the interlayer insulating structure comprises a non-porous layer without pores, a pore-containing layer with pores, and an air gap sequentially provided on the substrate, wherein respective volumes of the pores in the pore-containing layer increase monotonically with increased distance from a surface of the substrate. |
地址 |
KR |