发明名称 |
Method of fabricating semiconductor device |
摘要 |
A method of fabricating a semiconductor device includes forming a trench in a substrate, forming a pre-gate insulating film along side surfaces and a bottom surface of the trench, and oxidizing the pre-gate insulating film through a densification process. |
申请公布号 |
US9054037(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201314060806 |
申请日期 |
2013.10.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kim Dong-Chan;Park Tai-Su;Kim Ju-Eun;Nam Ki-Hong |
分类号 |
H01L21/336;H01L21/28;H01L29/51;H01L21/02;H01L27/108 |
主分类号 |
H01L21/336 |
代理机构 |
Lee & Morse, P.C. |
代理人 |
Lee & Morse, P.C. |
主权项 |
1. A method of fabricating a semiconductor device, the method comprising:
forming a trench in a substrate; forming a pre-gate insulating film along side surfaces and a bottom surface of the trench; oxidizing the pre-gate insulating film through a densification process; forming a first gate insulating film by oxidizing the pre-gate insulating film, and forming a gate electrode in the trench having the first gate insulating film to partially fill the trench. |
地址 |
Suwon-si, Gyeonggi-do KR |