发明名称 Method of fabricating semiconductor device
摘要 A method of fabricating a semiconductor device includes forming a trench in a substrate, forming a pre-gate insulating film along side surfaces and a bottom surface of the trench, and oxidizing the pre-gate insulating film through a densification process.
申请公布号 US9054037(B2) 申请公布日期 2015.06.09
申请号 US201314060806 申请日期 2013.10.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Dong-Chan;Park Tai-Su;Kim Ju-Eun;Nam Ki-Hong
分类号 H01L21/336;H01L21/28;H01L29/51;H01L21/02;H01L27/108 主分类号 H01L21/336
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A method of fabricating a semiconductor device, the method comprising: forming a trench in a substrate; forming a pre-gate insulating film along side surfaces and a bottom surface of the trench; oxidizing the pre-gate insulating film through a densification process; forming a first gate insulating film by oxidizing the pre-gate insulating film, and forming a gate electrode in the trench having the first gate insulating film to partially fill the trench.
地址 Suwon-si, Gyeonggi-do KR