发明名称 Oxide semiconductor thin film transistor and manufacturing method thereof
摘要 An oxide semiconductor thin film transistor includes a source, a drain, a channel layer, an insulation layer, a first conductor and a second conductor. The channel layer is disposed between the source and the drain, and separated from the source and the drain. The insulation layer covers the source, the drain and the channel layer. The first conductor is at least disposed in a first opening of the insulation layer so as to touch the source and the channel layer. The second conductor is at least disposed in a second opening of the insulation layer so as to touch the drain and the channel layer.
申请公布号 US9054202(B2) 申请公布日期 2015.06.09
申请号 US201313965176 申请日期 2013.08.12
申请人 Chunghwa Picture Tubes, LTD. 发明人 Chang Hsi-Ming
分类号 H01L29/12;H01L29/786;H01L29/66 主分类号 H01L29/12
代理机构 Jianq Chyun IP Office 代理人 Jianq Chyun IP Office
主权项 1. An oxide semiconductor thin film transistor, comprising: a source and a drain; a channel layer, disposed between the source and the drain and separated from the source and the drain; an insulation layer, covering the source, the drain, and the channel layer, wherein the insulation layer has a first opening and a second opening, the first opening exposing a portion of the source and a portion of the channel layer, and the second opening exposing a portion of the drain and a portion of the channel layer; a first conductor, at least disposed in the first opening to be coupled with the source and the channel layer; and a second conductor, at least disposed in the second opening to be coupled with the drain and the channel layer.
地址 Taoyuan TW