发明名称 |
Radiation detector with defective pixels prevention structure |
摘要 |
Provision is a radiation detector that allows eliminating short between electric wires crossing over each other via an interlayer insulating layer and thus suppression of defective detecting elements. A construction of this embodiment has a design idea that eliminates short between electric wires of an amorphous selenium layer and an active matrix substrate. Specifically, the electric wires are in a position covered with a thick center portion of the amorphous selenium layer. This ensures to separate the electric wires away from an electrode layer, achieving provision of a radiation detector capable of being used for a long period of time. |
申请公布号 |
US9054006(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201114119404 |
申请日期 |
2011.05.30 |
申请人 |
SHIMADZU CORPORATION |
发明人 |
Sato Kenji;Tsuji Hisao |
分类号 |
H01L31/115;H01L27/146 |
主分类号 |
H01L31/115 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A radiation detector comprising:
a matrix substrate arranged two-dimensionally and configured to read out signals from each of detecting elements; a semiconductor layer configured to generate carriers upon incidence of radiation; and an electrode layer configured to apply voltage, the matrix substrate, the semiconductor layer, and the electrode layer being laminated in this order, the semiconductor layer comprising a center portion with a layer thickness under the electrode layer and a tapered end portion thinner than the center portion, the matrix substrate comprising electric wires which cross each other, wherein a crossing portion where the electric wires cross each other when seen from the semiconductor layer is disposed in a position covered with the center portion of the semiconductor layer except for a position covered with the end portion. |
地址 |
Kyoto JP |