发明名称 Radiation detector with defective pixels prevention structure
摘要 Provision is a radiation detector that allows eliminating short between electric wires crossing over each other via an interlayer insulating layer and thus suppression of defective detecting elements. A construction of this embodiment has a design idea that eliminates short between electric wires of an amorphous selenium layer and an active matrix substrate. Specifically, the electric wires are in a position covered with a thick center portion of the amorphous selenium layer. This ensures to separate the electric wires away from an electrode layer, achieving provision of a radiation detector capable of being used for a long period of time.
申请公布号 US9054006(B2) 申请公布日期 2015.06.09
申请号 US201114119404 申请日期 2011.05.30
申请人 SHIMADZU CORPORATION 发明人 Sato Kenji;Tsuji Hisao
分类号 H01L31/115;H01L27/146 主分类号 H01L31/115
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A radiation detector comprising: a matrix substrate arranged two-dimensionally and configured to read out signals from each of detecting elements; a semiconductor layer configured to generate carriers upon incidence of radiation; and an electrode layer configured to apply voltage, the matrix substrate, the semiconductor layer, and the electrode layer being laminated in this order, the semiconductor layer comprising a center portion with a layer thickness under the electrode layer and a tapered end portion thinner than the center portion, the matrix substrate comprising electric wires which cross each other, wherein a crossing portion where the electric wires cross each other when seen from the semiconductor layer is disposed in a position covered with the center portion of the semiconductor layer except for a position covered with the end portion.
地址 Kyoto JP