发明名称 Fuse circuit and testing method of the same
摘要 A fuse circuit includes a data line, a plurality of fuse cells selectively programmed and electrically connected with the data line in response to respective selection signals, a dummy fuse cell electrically connected with the data line in response to a test signal, and a sense amplifier configured to sense a data of the data line. The fuse circuit includes a plurality of fuses, reduces the area thereof, and easily detects whether a sense amplifier operates properly or not in the fuse circuit.
申请公布号 US9052352(B2) 申请公布日期 2015.06.09
申请号 US201213595259 申请日期 2012.08.27
申请人 SK Hynix Inc. 发明人 Kim Kwi-Dong
分类号 G11C17/18;G01R31/07 主分类号 G11C17/18
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A fuse circuit, comprising: a data line; a plurality of fuse cells selectively programmed and electrically connected with the data line in response to respective selection signals; a dummy fuse cell electrically connected with the data line in response to a test signal; and a sense amplifier configured to sense a data of the data line.
地址 Gyeonggi-do KR