发明名称 | Fuse circuit and testing method of the same | ||
摘要 | A fuse circuit includes a data line, a plurality of fuse cells selectively programmed and electrically connected with the data line in response to respective selection signals, a dummy fuse cell electrically connected with the data line in response to a test signal, and a sense amplifier configured to sense a data of the data line. The fuse circuit includes a plurality of fuses, reduces the area thereof, and easily detects whether a sense amplifier operates properly or not in the fuse circuit. | ||
申请公布号 | US9052352(B2) | 申请公布日期 | 2015.06.09 |
申请号 | US201213595259 | 申请日期 | 2012.08.27 |
申请人 | SK Hynix Inc. | 发明人 | Kim Kwi-Dong |
分类号 | G11C17/18;G01R31/07 | 主分类号 | G11C17/18 |
代理机构 | IP & T Group LLP | 代理人 | IP & T Group LLP |
主权项 | 1. A fuse circuit, comprising: a data line; a plurality of fuse cells selectively programmed and electrically connected with the data line in response to respective selection signals; a dummy fuse cell electrically connected with the data line in response to a test signal; and a sense amplifier configured to sense a data of the data line. | ||
地址 | Gyeonggi-do KR |