发明名称 |
Pattern forming process |
摘要 |
A pattern is formed by coating a chemically amplified resist composition comprising a resin having a dissolution rate in an organic solvent developer that lowers under the action of acid onto a processable substrate, prebaking, exposing the resist film, PEB, developing in an organic solvent developer to form a negative pattern, coating a solution comprising Si, Ti, Zr, Hf or Al, prebaking, and dry etching to effect image reversal for converting the negative pattern into a positive pattern. |
申请公布号 |
US9052603(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201414170094 |
申请日期 |
2014.01.31 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
Hatakeyama Jun;Ogihara Tsutomu;Biyajima Yusuke |
分类号 |
G03F7/26;G03F7/40;G03F7/32;G03F7/20;G03F7/11;G03F7/00 |
主分类号 |
G03F7/26 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. A pattern forming process comprising the steps of:
coating a chemically amplified resist composition comprising a resin having a dissolution rate in an organic solvent developer that lowers under the action of acid, a photoacid generator capable of generating an acid upon exposure to high-energy radiation, and a first organic solvent, onto a processable substrate, prebaking the coating to remove the unnecessary solvent and to form a resist film, exposing patternwise the resist film to high-energy radiation, post-exposure baking, developing in an organic solvent developer to form a negative pattern, coating a solution comprising an element selected from the group consisting of silicon, titanium, zirconium, hafnium, and aluminum onto the negative pattern-bearing substrate, prebaking, and dry etching to effect image reversal for converting the negative pattern into a positive pattern. |
地址 |
Tokyo JP |