发明名称 Pattern forming process
摘要 A pattern is formed by coating a chemically amplified resist composition comprising a resin having a dissolution rate in an organic solvent developer that lowers under the action of acid onto a processable substrate, prebaking, exposing the resist film, PEB, developing in an organic solvent developer to form a negative pattern, coating a solution comprising Si, Ti, Zr, Hf or Al, prebaking, and dry etching to effect image reversal for converting the negative pattern into a positive pattern.
申请公布号 US9052603(B2) 申请公布日期 2015.06.09
申请号 US201414170094 申请日期 2014.01.31
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 Hatakeyama Jun;Ogihara Tsutomu;Biyajima Yusuke
分类号 G03F7/26;G03F7/40;G03F7/32;G03F7/20;G03F7/11;G03F7/00 主分类号 G03F7/26
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A pattern forming process comprising the steps of: coating a chemically amplified resist composition comprising a resin having a dissolution rate in an organic solvent developer that lowers under the action of acid, a photoacid generator capable of generating an acid upon exposure to high-energy radiation, and a first organic solvent, onto a processable substrate, prebaking the coating to remove the unnecessary solvent and to form a resist film, exposing patternwise the resist film to high-energy radiation, post-exposure baking, developing in an organic solvent developer to form a negative pattern, coating a solution comprising an element selected from the group consisting of silicon, titanium, zirconium, hafnium, and aluminum onto the negative pattern-bearing substrate, prebaking, and dry etching to effect image reversal for converting the negative pattern into a positive pattern.
地址 Tokyo JP