发明名称 |
Stylus abrasion detection method and surface property measurement device |
摘要 |
A stylus abrasion detection method includes obtaining a measurement curve of a standard specimen in which an unevenness that changes periodically is formed on a surface, by causing a stylus to trace along the surface of the standard specimen, detecting a displacement of the stylus in a direction perpendicular to the tracing direction, and using the displacement for obtaining the measurement curve; performing a frequency analysis on the measurement curve; calculating an abrasion amount of the stylus from a result of the frequency analysis; and displaying the abrasion amount calculated by the abrasion amount calculation. |
申请公布号 |
US9052182(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201113169448 |
申请日期 |
2011.06.27 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
Mishima Hideki;Kuroki Shingo |
分类号 |
G01B5/28;G01B21/04 |
主分类号 |
G01B5/28 |
代理机构 |
Greenblum & Bernstein, P.L.C. |
代理人 |
Greenblum & Bernstein, P.L.C. |
主权项 |
1. A stylus abrasion detection method that detects abrasion of a stylus with a surface property measurement device, the device causing a stylus to contact a surface of a measured object, while causing the stylus to trace the surface of the measured object by maintaining contact of the stylus against the surface, detecting a displacement of the stylus in a direction perpendicular to the tracing direction, and measuring a surface property of the measured object from the detected displacement amount of the stylus, the method comprising:
obtaining a measurement curve of a standard specimen in which a periodically-changing unevenness is formed on a surface, said obtaining the measurement curve comprising:
causing the stylus to trace the surface of the standard specimen;detecting a displacement of the stylus in a direction perpendicular to the tracing direction; andusing the displacement for obtaining the measurement curve; performing a Fast Fourier Transform frequency analysis on the measurement curve; calculating an abrasion amount of the stylus from a result of the frequency analysis by performing a filter process on the result of the frequency analysis such that only a wave height value shorter than an unevenness wave height value of the standard specimen remains; and displaying the abrasion amount calculated by the abrasion amount calculation. |
地址 |
Kanagawa JP |