发明名称 Non-planar transistors and methods of fabrication thereof
摘要 Non-planar transistors and methods of fabrication thereof are described. In an embodiment, a method of forming a non-planar transistor includes forming a channel region on a first portion of a semiconductor fin, the semiconductor fin having a top surface and sidewalls. A gate electrode is formed over the channel region of the semiconductor fin, and an in-situ doped semiconductor layer is grown on the top surface and the sidewalls of the semiconductor fin on opposing sides of the gate electrode using a selective epitaxial growth process. At least a part of the doped semiconductor layer is converted to form a dopant rich region.
申请公布号 US9054194(B2) 申请公布日期 2015.06.09
申请号 US201012652947 申请日期 2010.01.06
申请人 Taiwan Semiconductor Manufactruing Company, Ltd. 发明人 Tung Chih-Hang;Lin Chin-Hsiang;Chang Cheng-Hung;Sun Sey-Ping
分类号 H01L21/336;H01L29/78;H01L29/417;H01L29/66 主分类号 H01L21/336
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method of forming a non-planar transistor, the method comprising: forming a channel region on a first portion of a semiconductor fin, the semiconductor fin comprising a top surface and sidewalls; forming a gate electrode over the channel region of the semiconductor fin; forming a semiconductor layer on the top surface and the sidewalls of the semiconductor fin on opposing sides of the gate electrode using a selective epitaxial growth process and having a first doping concentration; growing an in-situ doped semiconductor layer over the semiconductor layer and on the top surface and the sidewalls of the semiconductor fin on opposing sides of the gate electrode using a selective epitaxial growth process and having a second doping concentration greater than the first doping concentration; and converting at least a part of the doped semiconductor layer to form a dopant rich region.
地址 Hsin-Chu TW