发明名称 SEMICONDUCTOR DEVICES HAVING THROUGH ELECTRODES AND METHODS FOR FABRICATING THE SAME
摘要 <p>The present invention relates to a semiconductor device including a through electrode and a manufacturing method thereof. An intermetallic insulation layer with carbon is formed on a substrate. A via hole which vertically passes through the intermetallic insulation layer and the substrate is formed. The carbon is supplemented on the surface of the intermetallic insulation layer exposed through the via hole. A via insulation layer to cover the inner wall of the via hole is formed. A through electrode surrounded by the via insulation layer is formed in the via hole.</p>
申请公布号 KR20150062626(A) 申请公布日期 2015.06.08
申请号 KR20130147475 申请日期 2013.11.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, KYU HEE;KANG, PIL KYU;YIM, TAE JIN;LEE, NAE IN
分类号 H01L23/48 主分类号 H01L23/48
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