| 摘要 |
PROBLEM TO BE SOLVED: To provide a measurement device that is less affected by noise.SOLUTION: The measurement device comprises: irradiation means for irradiating an object to be measured with slit light from a prescribed irradiation direction; image-capturing means for capturing the image of the object to be measured irradiated with the slit light by the irradiation means from a prescribed image-capturing direction different from the irradiation direction, and outputting an image-capture signal; measurement signal creation means for creating a measurement signal on the basis of the image-capture signal; correlation calculation means for performing correlation calculation between the measurement signal and a prescribed slit-light luminance distribution model; and specification means for specifying a slit-light irradiation range in the measurement signal on the basis of the result of correlation calculation by the correlation calculation means. |
