发明名称 |
METHOD FOR MANUFACTURING A SENSOR CHIP FOR THE DIRECT CONVERSION OF X-RAYS, A SENSOR FOR THE DIRECT CONVERSION OF X-RAYS AND THE DENTAL RADIOLOGY APPARATUS FOR USING SUCH A SENSOR |
摘要 |
This invention relates to a method to manufacture a chip to detect the direct conversion of X-rays. It also relates to a direct conversion detector for X-rays using such a chip and dental radiology equipment using at least one such detector.;The method to manufacture the wafer comprises a step for applying pressure (3, 4, 4a) to a powdered polycrystalline semiconductor material and a step for heating (5-9) during a set time period. It comprises a preliminary step for providing an impurity level of at least 0.2% in the polycrystalline semiconductor material. |
申请公布号 |
US2015155421(A1) |
申请公布日期 |
2015.06.04 |
申请号 |
US201214408368 |
申请日期 |
2012.06.21 |
申请人 |
Biava Dominique;Rault Mathieu;Inglese Jean-Marc;Bothorel Sylvie;Gourier Didier;Binet Laurent;Barboux Philippe;Ponpon Jean-Pierre |
发明人 |
Biava Dominique;Rault Mathieu;Inglese Jean-Marc;Bothorel Sylvie;Gourier Didier;Binet Laurent;Barboux Philippe;Ponpon Jean-Pierre |
分类号 |
H01L31/18;H01L31/08;A61B6/14;H01L31/0368 |
主分类号 |
H01L31/18 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
Marne La Vallee FR |