发明名称 MULTILAYER STRUCTURE, DEVICE USING THE SAME, METHOD FOR PRODUCING THE MULTILAYER STRUCTURE, AND METHOD FOR PRODUCING THE DEVICE
摘要 Provided are a novel multilayer structure that can be used to protect a device and a device using the multilayer structure. The disclosed multilayer structure is a multilayer structure including a substrate and a barrier layer stacked on the substrate. The 3% strain tension of the substrate in at least one direction is at least 2000 N/m. The barrier layer contains a reaction product (R). The reaction product (R) is a reaction product formed by a reaction at least between a metal oxide (A) and a phosphorus compound (B). In an infrared absorption spectrum of the barrier layer in a range of 800 to 1400 cm−1, a wavenumber (n1) at which maximum infrared absorption occurs is in a range of 1080 to 1130 cm−1. A metal atom constituting the metal oxide (A) is essentially an aluminum atom.
申请公布号 US2015155409(A1) 申请公布日期 2015.06.04
申请号 US201314407582 申请日期 2013.06.12
申请人 KURARAY CO., LTD. 发明人 Nakaya Masakazu;Higashida Noboru;Yoshida Kentaro;Sasaki Ryoichi;Shibata Manabu;Oshita Tatsuya
分类号 H01L31/048;H01L31/18;H01L51/56;H01L33/56;H01L51/52 主分类号 H01L31/048
代理机构 代理人
主权项 1. A multilayer structure comprising: a substrate; a barrier layer stacked on the substrate, and a deposited inorganic layer; wherein: a 3% strain tension of the substrate in at least one direction is at least 2000 N/m, the barrier layer comprises a reaction product (R), the reaction product (R) is a reaction product formed by a reaction at least between a metal oxide (A) and a phosphorus compound (B), in an infrared absorption spectrum of the barrier layer in a range of 800 to 1400 cm−1, a wavenumber (n1) at which maximum infrared absorption occurs is in a range of 1080 to 1130 cm−1, and a metal atom constituting the metal oxide (A) is essentially an aluminum atom.
地址 Kurashiki-shi, Okayama JP