| 发明名称 |
MICROWAVE THERMAL NANO-PROCESS APPARATUS FOR COLLECTING RAMAN SCATTERED LIGHT IN REAL TIME |
| 摘要 |
<p>The present invention relates to a structure of a microwave thermal nano-process apparatus capable of measuring a temperature of a substance of a nano material or the like in a substance selective manner by combining a Raman spectrum analysis technique.</p> |
| 申请公布号 |
KR20150061325(A) |
申请公布日期 |
2015.06.04 |
| 申请号 |
KR20130145306 |
申请日期 |
2013.11.27 |
| 申请人 |
KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE |
发明人 |
KIM, DAE HO;SEOI, SEUNG KWON;CHANG, WON SUK |
| 分类号 |
G01N1/44;B82B3/00;G01N21/65;G01N22/00 |
主分类号 |
G01N1/44 |
| 代理机构 |
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