| 发明名称 |
MEASURING ELECTRONICS COMPRISING A CONTACT STRUCTURE |
| 摘要 |
The invention relates to a spring contact structure for contacting an electronic assembly and at least one contact element of an electric or electronic component, wherein the contact element is a projecting metallically conducting element and the electronic assembly has at least one resilient contact element which is supported by the contact element in an electrically conducting manner when force is applied to it. The invention also relates to a measuring device and a battery device. |
| 申请公布号 |
US2015153390(A1) |
申请公布日期 |
2015.06.04 |
| 申请号 |
US201314401913 |
申请日期 |
2013.05.16 |
| 申请人 |
HELLA KGAA HUECK & CO. ;MILJØBIL GRENLAND AS |
发明人 |
Köhler Ulrich;Greilich Alexej;Stoiber Roman;Engen Egil;Wiik Øberg Sverre;Ivarrud Brisendal Lars |
| 分类号 |
G01R1/067;G01R31/36 |
主分类号 |
G01R1/067 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measuring apparatus having a spring contact-making structure for at least one contact element of an electrical or electronic unit to make contact with the measuring apparatus, wherein the contact element is a protruding metallically conducting element, and the electronic assembly has at least one resilient contact-making element which is supported in an electrically conductive manner on the contact element when force is applied to it. |
| 地址 |
Lippstadt DE |
