发明名称 System and Method of Blink Detection for an Adaptive Optics System
摘要 An optical imaging system, method, and medium for imaging a subject. Measure an aberration state of light from the subject is measured. Determine a condition of the subject based on the aberration state of the light, and if the subject is in a first condition or a second condition. An aberration correction device that adjusts a state of the light. In a first case if the subject is in the first condition than the light is adjusted based on the aberration state of the light used to determine that the subject is in the first condition. In a second case if the subject is in the second condition than the light is adjusted based on based on a most recent aberration state of the light that was used to determine that the subject was in the first condition prior to detecting that the subject is in the second condition.
申请公布号 US2015150450(A1) 申请公布日期 2015.06.04
申请号 US201414558574 申请日期 2014.12.02
申请人 CANON KABUSHIKI KAISHA 发明人 NOZATO Koji
分类号 A61B3/113;A61B3/11;A61B3/10;A61B3/14 主分类号 A61B3/113
代理机构 代理人
主权项 1. An optical imaging system for imaging a subject comprising: one or more optical components for receiving light and transmitting the received light to a subject to be imaged; an aberration detection device that measures an aberration state of light from the subject; a controller that determines a condition of the subject based on the aberration state of the light detected by the aberration detection device, and determines if the subject is in a first condition or a second condition; and an aberration correction device that adjusts a state of the light, wherein: in a first case if the subject is in the first condition than the aberration correction device adjusts the light based on the aberration state of the light detected by the aberration detection device that was used to determine that the subject is in the first condition; andin a second case if the subject is in the second condition than the aberration correction device adjusts the aberration state of the light based on a most recent aberration state of the light detected by the aberration detection device that was used to determine that the subject was in the first condition prior to detecting that the subject is in the second condition.
地址 Tokyo JP