Portable three-dimensional metrology with data displayed on the measured surface

摘要

A portable instrument for 3D surface metrology projects augmented-reality feedback directly on the measured target surface. The instrument generates structured-light measuring-patterns and projects them successively on a target surface. Features, contours, and textures of the target surface distort each projected measuring-pattern image (MPI) from the original measuring-pattern. The instrument photographs each MPI, extracts measurement data from the detected distortions, and derives a result-image from selected aspects of the measurement data. The instrument warps the result-image to compensate for distortions from the projector or surface and projects the result-image on the measured surface, optionally with other information such as summaries, instrument status, menus, and instructions. The instrument is lightweight and rugged. Accurate measurements with hand-held embodiments are made possible by high measurement speed and an optional built-in inertial measurement unit to correct for pose and motion effects.

主权项

1. An apparatus for measuring a surface, the apparatus comprising:
a portable housing, a projection assembly mounted in the portable housing and projecting an image on the surface, a camera mounted in the portable housing and configured to capture the projected image as measurement data, and a processor controlling the projection assembly and the camera and receiving the measurement data from the camera, where
the projection assembly comprises an image generator, a light source, and a train of projection optics,the projected image comprises a measurement-pattern image or a result image, andthe processor derives a characteristic of the result-image by analyzing the measurement data corresponding to the measurement-pattern image.