发明名称 METHOD FOR CONDUCTING OPTICAL MEASUREMENT USING FULL MUELLER MATRIX ELLIPSOMETER
摘要 A method for conducting optical measurement using a full Mueller matrix ellipsometer, which belongs to the technical field of optical measurements. The optical measurement method comprises: constructing an experimental optical path of a full Mueller matrix ellipsometer; conducting complete regression calibration on the full Mueller matrix ellipsometer; placing a sample to be measured on a sample platform, and obtaining an experimental Fourier coefficient of the sample to be measured; and according to the experimental Fourier coefficient of the sample to be measured, obtaining information about the sample to be measured. Since a calibration method for the full Mueller matrix ellipsometer is not only simple in operation process, but also makes full use of data of the full Mueller matrix ellipsometer measured at the same time, the introduced error is relatively small and the parameter obtained by calibration is more accurate, so that the measurement result is more accurate when the sample to be measured is measured. Thus, the process of the optical measurement method is simplified.
申请公布号 WO2015078202(A1) 申请公布日期 2015.06.04
申请号 WO2014CN84683 申请日期 2014.08.19
申请人 BEI OPTICS TECHNOLOGY COMPANY LIMITED 发明人 LIU, TAO;CUI, GAOZENG;LI, GUOGUANG;XIONG, WEI;WEN, LANGFENG
分类号 G01N21/21 主分类号 G01N21/21
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